fib, Iso 9001, Ion Mill, Iso 14001, failure analysis techniques, EDX, Sem, mechanical cross-sectioning

fib, nano-probing techniques, high-energy beam systems, AFM, site-specific preparation, Failure Analysis, materials characterization, electron microscopy, plasma FIB sample preparation, TEM, transistor nano-probing, electrical characterization, device physics

laboratory safety , metal-organic frameworks (MOFs), gas sensing, FTIR spectroscopy, nanomaterials, experimental data analysis, volatile organic compound adsorption, SEM-EDS, MOF-derived metal oxides, electrical measurements, Xps, PXRD, gas adsorption analysis

reach compliance , Testing, Microsoft Excel, Iso 9001, QA QC inspection, CMM programming, inspection material testing, Iso 17025, quality documentation, quality management systems

Iso 9001, Iso 14001, Technology Transfers, Statistical analytical skills, Process improvement, Six Sigma Green Belt, Chemical manufacturing processes, Scale Up of newly developed product, Total cost of ownership reduction

shot peening , nadcap , Root Cause Analysis, Iso 9001, Heat Treatment, Fmea, chemical processing, Fishbone, 5 Whys, As9100, Non-conventional machining

Advanced Analytics, Machine Learning, NAND flash architectures, AI techniques, memory circuits, semiconductor devices, simulation-to-silicon correlation, regression methodologies, silicon characterization methodologies, pre-silicon simulation environments, Jmp, statistical evaluation using Python, Failure Analysis, data analysis scripting, DFT probe test infrastructure, CMOS MOSFET device physics

Iso 13485, Iso 9001, Fmea, Spc, Control Plans, 8D, Root Cause Analysis, Capa

fib, Iso 14001, Semiconductor devices, Technical report generation, Microelectronics, Root cause investigation, Failure characterization, Ion Mill, Iso 9001, Mechanical Cross-sectioning, EDX, Sem, SI processing, Failure Analysis techniques

Optical microscope inspection, EDX analysis, Sample coating