Scanning Electron Microscopy (SEM), Cross-sectioning, image analysis, mounting, Semiconductor package sample preparation, PCB manufacturing processes, Metrology, polishing, Grinding, optical microscopy, Technical reporting software

metallographic sample preparation, Gcms, EDS, Mechanical Testing Systems, Reliability Testing Systems, optical measurement systems, Ftir, hardness mechanical testing machines, Real time X-ray radiography, xrf, Sem, Analytical Chemistry

Ftir, TGA, X-ray, xrf, SEM-EDS, digital microscope

SRP, EDX, Microsoft Word, Sem