Dac, Jtag, ADC, device characterization, Pll, SmarTest 8, SmarTest 7, ATPG, Scan, Advantest 93k, Mixed Signal IP, Functional Mbist, Teradyne UFLEX

test time reduction , Jtag, MBIST, First-silicon bring-up, ATPG, ATE scripting, J750, Final Test, Wafer Sort, device characterization, Teradyne UltraFLEX, Test optimization, Yield analysis, V93K, Scan, ATE test program development, Yield improvement, Advantest V93000, Digital vector debug