Design of device test structures, Detailed characterization of devices, Experience in detailed electrical characterization of devices, Familiarity with layout and design rules, Design development and characterization of MOSFETs, Detailed analysis of electrical test data and characterization results, Working with TCAD engineers to predict device split results, process integration

electrical characterization, CMOS-based sensors, device test structures, non-volatile memory cells, MOSFETs, Modeling, TCAD, process integration