surface preparation technologies, Xrd, DOE-based approaches, ECP, ellipsometry, materials characterization, thin-film deposition, pecvd, ald, TEM, Sem, PVD

SOM Thermal Microscope, fib, CSAM, XRM, Sem, AFP, OM

Scripting, Data Analysis, solid state devices, AFM, Process Control, advanced data analysis techniques, Plasma-CVD, sims, TEM, Sem, computer skills including MS Office, Xps, diffusion

sample preparation , fib, Ion miller, Cross section, Parallel lapping, 3D X-ray, EDX, Sem, Chemical decapsulation

Particle Counters, Iso, IEC 17025, ellipsometry, Analytical Methods, Glp, TOC Analyzer, CP-MS, ion chromatography, Ic, Msa, Sem, ICP-OES