Sr Assoc Eng Failure Analysis

. Perform TEM (transmission electron microscopy) sample preparation using Focused-ion beam/Scanning Electron Microscope for semiconductor failure analysis and characterization.
. Perform pre-FIB related sample preparation such as optical microscope inspection, Si wafer navigation, chip delayering, RIE etching, sputter coating, and etc.
. This role requires to work in the 12hr night-shift pattern.
. Participate in new failure analysis techniques development and evaluation of new technologies
. Demonstrate a sense of urgency and quality mindset to support urgent and critical Fab operation requests.

. Perform TEM (transmission electron microscopy) sample preparation using Focused-ion beam/Scanning Electron Microscope for semiconductor failure analysis and characterization.
. Perform pre-FIB related sample preparation such as optical microscope inspection, Si wafer navigation, chip delayering, RIE etching, sputter coating, and etc.
. This role requires to work in the 12hr night-shift pattern.
. Participate in new failure analysis techniques development and evaluation of new technologies
. Demonstrate a sense of urgency and quality mindset to support urgent and critical Fab operation requests.