Senior Silicon Design Engineer - DFT

THE ROLE:

We are looking for an adaptive, self-motivative design verification engineer to join our growing team. As a key contributor, you will be part of a leading team to drive and improve AMD's abilities to deliver the highest quality, industry-leading technologies to market. The Verification Engineering team furthers and encourages continuous technical innovation to showcase successes as well as facilitate continuous career development.

THE PERSON:

You have a passion for modern, complex processor architecture, digital design, and verification in general. You are a team player who has excellent communication skills and experience collaborating with other engineers located in different sites/timezones. You have strong analytical and problem-solving skills and are willing to learn and ready to take on problems.

KEY RESPONSIBILITIES:

• Own the generation, validation, and delivery of scan test patterns for next-generation SERDES IPs and SOCs.
• Partner with product test teams during test bring-up and troubleshoot pattern, model, and netlist issues.
• Improve scan architecture, scan coverage, test models, execution methods, and overall product quality.
• Perform ATPG pattern and gate-level netlist analysis to identify and resolve testability and coverage issues.
• Collaborate with physical design engineers to support design closure through static timing, clock-domain crossing, netlist, and power analysis.
• Address DFT requirements for high-frequency Phy IP designs while minimizing performance impact.
• Resolve complex interactions between intellectual property and system-on-chip design environments across global teams.
• Develop and implement improvements that simplify design complexity and strengthen engineering quality.

PREFERRED EXPERIENCE:

• Experience with design-for-test methodologies, particularly scan test and automatic test pattern generation with Tessent flows.
• Strong working knowledge of industry-standard ATPG tools and their application to pattern generation, fault coverage, and product quality.
• Experience debugging ATPG patterns, scan structures, test models, and gate-level netlists.
• Understanding of IEEE 1149.1 boundary scan, IEEE 1500 embedded core test, and memory built-in self-test concepts.
• Experience with multi-clock and multi-power-domain designs.
• Familiarity with static timing analysis, clock-domain crossing analysis, static power analysis, and physical design closure.
• Experience adapting standard DFT tools or methods to meet the performance requirements of complex, high-frequency designs.
• Demonstrated success collaborating across design, physical design, product engineering, and geographically distributed teams.

ACADEMIC CREDENTIALS:

• Bachelors or Masters degree in computer engineering/Electrical Engineering