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R&D Engineer IC Design

R&D Engineer IC Design

Broadcom
8-10 Years
Not Disclosed
  • Posted 21 hours ago
  • Be among the first 10 applicants

Job Description

Job Description:

The candidate would be required to work on various phases of SoC DFT related activities for Broadcom APD (ASIC Product Division)s designs – DFT Architecture, Test insertion and verification, Pattern generation, Coverage improvement, Post silicon debug and yield improvement to meet the product test metrics. It involves working with the Physical Design & STA team for DFT mode timing closure. The role could also involve direct interaction with external customers.

The candidate should have in-depth knowledge of DFT concepts and should be well experienced in various aspects of DFT -ATPG, MBIST & JTAG. The candidate should have worked on DFT insertion & verification, pattern generation, coverage improvement, vector simulation, post-silicon debug. Strong problem solving & debugging skills are a must. Expertise in scripting languages such as perl, shell, etc. is an added advantage. Experience with either Mentor Graphics DFT tools (TestKompress, Fastscan) is highly desirable.

The candidate should have worked with team across multiple geographies. The candidate should be able to handle his/her work independently and also supervise the work of other team members as required. The candidate should possess excellent communication skills.

Educational qualification & Experience Level : Bachelor's degree with 8+ years of relevant experience or Master's degree with 6+ years of relevant experience

R027600

More Info

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Key Skills

Test insertion and verification

DFT concepts

Yield improvement

Coverage improvement

Post silicon debug

Mentor Graphics DFT tools

Pattern generation

Vector simulation

DFT Architecture

About Company

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Skills:
Jtag, Test insertion and verification, DFT concepts, Yield improvement, MBIST, Coverage improvement, Post silicon debug, ATPG, Mentor Graphics DFT tools, Pattern generation, Vector simulation, TestKompress, DFT Architecture, FastScan