Automated Test Equipment (ATE), UFLEX, RF SOC semiconductor devices, IC manufacturing and production flow, Statistical methods, Yield test coverage, Product characterization, Root-cause analysis, Verigy 93K platforms, Data analysis tools

Scripting, Statistics and data analysis tools, AI tools, Verilog simulations, Project management, Circuit debug, CAD Tools, Electrical and Electronics Engineering, Manufacturing test flow development, Test coverage optimization

Statistical process control (SPC), Report Generation, Data Analysis, Quality Management System, Optics FA processes and tools, Transceiver products, Yield analysis, Reliability Testing, NPI support, Optical transceiver manufacturing, Quality control best practices, Root cause corrective action, Process and yield qualification, Manufacturing BOMs, Optical assembly processes, Root cause problem solving, Process implementation for optical products, Debug failure analysis

Python, scripting tools, device physics, Jmp, DRAM architecture, Statistics, Data Analysis, CMOS technology