Environmental Management Systems (EMS), Minitab, Root Cause Analysis, Fmea, Spc, Lean Manufacturing, Doe, Six Sigma, Jmp

Novellus Sequel, Novellus Altus, Fmea, DxZ, design of experiments, HDP Centura, Tel Scrubbers, Lean Six Sigma, Statistical Process Control, CVD Process engineering, Electro-plating, Endura, mocvd, Producer Centura, SACVD, pecvd, WxZ, Thermal CVD, HDPCVD

thin-film semiconductor processes, Fmea, Spc, Doe, 8D

statistical data analysis , Visual Basic, Fmea, Spc, wafer manufacturing processes, Fishbone, Doe, 8D, Jmp

statistical data analysis , Equipment qualification, Fmea, Spc, FDC, 8D

Pmo, 8D reporting, Post-bond anneal process development, Fmea, Spc, Process development, Troubleshooting, SPC monitoring, Qualification support, Tool setup qualification, Doe, Recipe optimization, Process window definition

Measurement System Analysis (MSA), Overall Equipment Effectiveness (OEE), Change Control, Validation, Process Improvement, Process Fmea, Manufacturing Engineering

Measurement System Analysis (MSA), Overall Equipment Effectiveness (OEE), Change Control, Validation, Process Improvement, Process Fmea, Manufacturing Engineering

Materials science and nanotribology knowledge, Process improvement skills, Lubricant design and synthesis, Chemistry knowledge, Advanced data analysis, Proficiency in Minitab, Statistical Process Control