verigy 93k , Automated Test Equipment (ATE), UFLEX, data analysis tools, statistical methods

analog circuits , Tableau, Python, AI tools, data analysis tools, LLMs, electrical failure analysis, NAND Flash reliability test flows, Process Engineering, Jmp, high-volume statistical data analysis, device physics

resource coordination , FAA, Product Documentations, Root Cause Analysis, Electronics Engineering, Npi, Process Manufacturing, Capa, Manufacturing Projects, implement production, Technical Product Support, Issue Resolution, Liaising with cross functional teams, Iso-13485, Communication, Analytical Approach

Testing, Product Release, Technical Troubleshooting, Design-Build, Electronics Engineering, Quality Management, Foundry, Npi, engineering validation, Introducing New Products, Product Development, Semiconductor Manufacturing, Automotive Electronics manufacturing, Electrical Engineering, Data Analysis, Product Design, Pilot Production, New Product Introduction, Validation Procedures, device physics

Microsoft Office, Engineering Drawings, Total Productive Maintenance TPM, test equipment troubleshooting, Schematics

Statistical process control (SPC), Report Generation, Data Analysis, Quality Management System, Optics FA processes and tools, Transceiver products, Yield analysis, Reliability Testing, NPI support, Optical transceiver manufacturing, Quality control best practices, Root cause corrective action, Process and yield qualification, Manufacturing BOMs, Optical assembly processes, Root cause problem solving, Process implementation for optical products, Debug failure analysis

Test Methodologies, DMMs, Fmea, Oscilloscopes, Equipment, problem-solving tools, Instrumentation, Six Sigma methodologies, 8D, spectrum analyzers

Auto Test Equipment, device physics, Advantest 93K, UltraFlex test handler, Semiconductor Manufacturing, debug skills, Test Development, quality management tools, wafer prober, yield analysis

Tableau, Python, NAND technology, Jmp, digital analog circuits, data analysis tools, Failure Analysis, memory architectures, Process Engineering, semiconductor devices reliability, device physics, Statistics, AI tools