BGA package, Excel Office Suite, Jmp

Automated Test Equipment (ATE), UFLEX, RF SOC semiconductor devices, IC manufacturing and production flow, Statistical methods, Yield test coverage, Product characterization, Root-cause analysis, Verigy 93K platforms, Data analysis tools

ocap, Process Engineering, NPI Program Management, Fmea, JMP analysis, Control Plan

Statistical Process Control (SPC), C, C++, Sql, Python, design of experiments, Oscilloscopes, Pulse generators, Etest Product engineering, Jmp, Multimeters, Advantest 93K or equivalent memory testers, SMUs

ATE platforms, yield analysis, Cost Reduction, production issue resolution, analytical troubleshooting, test program debug, final test, Production Support, test optimization, Failure Analysis, system-level test, wafer sort, Advantest V93000, manufacturing test flows, Manufacturing Operations, quality enhancement, semiconductor test methodologies

Matlab, Data Analysis, Minitab, thermocompression bonding, flip chip die attach, Jmp

MATLAB, Pandas, C, Linux, Python, Digital scan, Analog and DC parameters, Firmware-driven test modes, Bench instrumentation, Load boards, ATE test programs, Probe cards, Mixed-signal ICs, Jmp, High-speed signal path, High-speed ICs, Signal Integrity, Network Analyzers, VNAs, Opto-electrical fixturing, scopes, BERTs, SMUs