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Showing 3 jobs
Skills:
test program development , device characterization, Debug of digital vectors, Digital PMIC RF Mixed Signal products, SmarTest 8, SmarTest 7, Characterization of Mixed Signal IP ADC DAC PLL, ATPG, Advantest 93k, Digital Electronics, Functional Mbist, Teradyne UFLEX, JTAG SCAN
Skills:
Functional Test, device characterization, ATPG, Digital vector debugging, MBIST, Teradyne UFLEX, JTAG SCAN
Skills:
statistical data analysis , LabVIEW, UFlex, Teradyne IFlex, Power Management IC measurement techniques, Advantest 93K ATE, root-cause investigation, wafer sort final testing
