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Showing 9 jobs
Skills:
automation, Scripting, scan compression, BSCAN, MBIST, Siemens Tessent, SSN TestKompress, DFT architecture, ATPG, EDA Tools, Synopsys TetraMAX, DFTMAX, LBIST, IJTAG
Skills:
boundary scan , Debugging, Tessent tools, coverage analysis, clock analog observe PLL RO, DFT – Scan ATPG, thermal sensors, SSN EDT, JTAG networks, DFX DV for IP debug units, TDR verification, clock-stop features, scan pattern generation, test-case development, AFM fault models, scan pattern simulation, root-cause analysis
Skills:
boundary scan , Perforce, Jtag, Git, Perl, Tcl, Verilog Hdl, Synopsys SMS SHS flow, Scan DRC flows, Mentor, Cadence, Siemens Tessent, AT-Speed SCAN, Dft, ATE silicon debug, EDA Tools, IJTAG, Multimedia subsystems DFT, MBIST, Shell flow, IO BIST, ATPG, Stuck-AT, Synopsys
Skills:
perl, Vcs, Jtag, shell scripting, Awk, Design Compiler, Verdi, Fusion Compiler, BIRA, NCSim, MBIST, Tessent, ATPG, TetraMax Tool, BISR, Modelsim, Tester scan
Skills:
simulation and verification flow, DFT design and verification, silicon bringup, DFT technologies, fault modeling, ASIC DFT synthesis, leading DFT activities, IP integration, DFT specification definition, SoC cycles, silicon debug activities
Skills:
Gate Level Simulations, stuck-at transition, Scan Insertion, memory repair solutions, MBIST, JTAG boundary scan, bridge path delay, DFT architecture, EDA Tools, DRC, IEEE 1149.1, ATPG pattern generation, scan chain stitching, DFT rule checks
Skills:
Python, Clp, Tcl, Perl, JTAG BSCAN, MBIST, LEC, SoC DFT Architecture, Logic and DRC analysis, P1500 implementation, ZERO delay and SDF based scan, ATPG DRC analysis, Memory BIST implementation, Hybrid-TK Compression, LPCT, Stuck at TDF, Scan Insertion, power analysis methodologies, Test coverage debug, JTAG simulations, Bridging Cell-aware iddq fault models, LBIST, iJTAG
Skills:
Dft, SSN, Simulation, Synopsys, Scan Insertion, Memory BIST, ATPG, DRC Coverage, Sms, pdl, IJTAG, ICL, Debug, occ, TetraMax
Skills:
Debugging, Logic Design, Sta, On-chip scan compression, ATPG, Gate level simulation, Fault Simulation, Automation methods, Scan BIST, Fault Models
