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Showing 3 jobs
Skills:
Dac, Jtag, device characterization, ADC, Pll, SmarTest 8, SmarTest 7, ATPG, Advantest 93k, Scan, Mixed Signal IP, MBIST, Teradyne UFLEX
Skills:
Functional Test, device characterization, ATPG, Digital vector debugging, MBIST, Teradyne UFLEX, JTAG SCAN
Skills:
statistical data analysis , LabVIEW, UFlex, Teradyne IFlex, Power Management IC measurement techniques, Advantest 93K ATE, root-cause investigation, wafer sort final testing
