Artificial Intelligence (AI), Atomic Force Microscopy (AFM), White Light Interferometry (WLI), Focused Ion Beam (FIB), Scanning Electron Microscopy (SEM), Machine Learning (ML), Metrology defect detection, Non-contact characterization methods, Metrology data analytics, Optical Interferometry

nano-indentation, Xrd, sims, auger, Xps

chemical kinetics, mass transport, data analysis systems, TEM, Sem, Xps, films and interface engineering, sims, EDX, Thermodynamics, Chemistry, Ftir