Failure analysis methodologies and techniques, Delayering, Electrical fault analysis, AFM, Ion Milling, fib, Plasma FIB, TEM, Sem, Xps, X-ray CSAM, EDX, Decapsulation, Data Analysis, Ftir

Data Analytics, programming, Fmea, Spc, Ai, 8D

Java, Statistical Analysis, C++, Data-driven decision-making, Oscilloscopes, THD, DACs, MEMS sensors, SmarTest 7, Dft, FFT, IIR filtering, SNR, ATE diagnostics, Advantest 93000, Digital communication interfaces, Process Optimization, ADCs, Spectrum analyzers, Frequency response analysis, Data analysis tools, Sampling theory, Software version control, Nyquist criteria