fib, nano-probing techniques, high-energy beam systems, AFM, site-specific preparation, Failure Analysis, materials characterization, electron microscopy, plasma FIB sample preparation, TEM, transistor nano-probing, electrical characterization, device physics

sample preparation , Nano-probing techniques, electron microscopy, Electrical characterization, Tool troubleshooting, Failure Analysis, device physics, Materials characterization, Plasma FIB sample preparation