Java, C, Jtag, VTRAN, data analysis tools, ATE platforms, IEEE1500, MemBIST, Jmp, Pcb Layout, test hardware design, BSACAN, Advantest V93K, ATE test vector conversion tools, ATPG, schematic capture, TDF, CMOS SoC testing, Scan, digital analog and MXS test programming, DFT pattern implementation

Descum, Fmea, lithography, Spc, Ball drop process, Etching, Sputter, Jmp, APQP standard, Project Management Certification, WLCSP bumping process, 2P2M DOE, Plating

Problem Solving Techniques, WLCSP, Dmaic, Fmea, Wafer Sort, Spc, Final Test, Doe, Statistics, 8D, manufacturability

Statistical Analysis, Iso 13485, Fmea, Validation protocols, FDA QMSR 21 CFR Part 820, Spc, Gmp, Msa, Quality Tools

Test Automation Tools, Quality Assurance, Testing Methodologies

measurement tools , Quality Assurance, Microsoft Office Applications, Engineering Drawings, Root Cause Analysis, Spc, Control Plans, Manufacturing Quality Processes, Helium Leak Testing, BOMs, Inspection Equipment, FAI, Capa, 8D Reports, Quality Documentation Systems, Cleanroom Requirements, Pfmea, Msa, Dimensional Inspection Techniques, Risk Assessment Methodologies, Quality Control

capas , Quality Assurance, Internal Audit, IQ OQ PQ, PFMEAs, First Article Inspections, Device History Records, Design Transfers, Sample Evaluation, NCRs, Documentation Control, Quality Management System, Deviation Reports, Process Validations, Measurement Inspection Tools, Reading Engineering Drawings