Equipment selection and qualification, Process Characterization, Cost Reduction, Statistical methods, Cycle time improvement, Process stability, Lithography Process, Productivity Improvement

Data Analysis, Spc, Troubleshooting, Process Optimization, plasma etch, failure analysis techniques, Doe, yield improvement, Dry Etch

Environmental Management System (EMS), SAP, Process Optimization, Lean Manufacturing, Six Sigma, BOM and Routing setup

Autocad

Microsoft Office, Kaizen, Productivity Improvement, Cost Reduction, Autocad, Lean Manufacturing, Pfmea, Six Sigma, QCP, process validation per ISO 13485, Yield Improvement

Process Modelling, Commissioning Plans, Process Flow Diagrams, Hydraulic Profiles, Technical Support, Sops, Autocad

Microsoft Office, QCP, Productivity Improvement, Lean, Cost Reduction, process validation per ISO 13485, Pfmea, Kaizen, Six Sigma, Yield Improvement, Autocad

data analysis tools, CMP fundamentals, semiconductor manufacturing principles, AMAT Mirra, Cu CMP, Process Engineering, Lean Six Sigma