Process Capability, Electrical Electronics Engineering, process excursion control, Microsoft Applications, Failure Analysis, Continuous Improvement, product sensitivity related low yield, CMOS fabrication technology, Root Cause Analysis

Test Methodologies, DOE design execution, Wafer Fab process integration, Technical process problem solving, process integration, Continuous process device improvement

Commissioning, Graduate Recruitment, Electronics Engineering, Written and Verbal Communication Abilities, Powerpoint, Instrumentation, Process Engineering, Chemical Engineering, Soft Skills, Materials Engineering, Electrical Engineering, Programme Management, process integration, Project Planning

Tableau, non-volatile memories NAND, process integration optimization, Jmp, NAND process flow, Data Analysis, yield reliability issues

wafer inspection, process integration, semiconductor fabrication processes, wafer fabrication, optical microscopy, defect analysis tools, Sem

photolithography, Data Analysis, Experimental lot requests, Failure Analysis, WAT, Etching, Semiconductor processes, Thin Films, Inline control plans, Automation implementation, diffusion

process qualification , module development , semiconductor tooling, semiconductor process integration, integration debugging, device characterization

defect issue investigation, Engineering logistic handling, Cpk report generating, process integration, Ms Office Applications, yield monitoring, ET sort report generating