device test structures, layout and design rules, process integration, CMOS-based sensors, electrical characterization, non-volatile memory cells

Design of device test structures, Detailed characterization of devices, Experience in detailed electrical characterization of devices, Familiarity with layout and design rules, Design development and characterization of MOSFETs, Detailed analysis of electrical test data and characterization results, Working with TCAD engineers to predict device split results, process integration