overlay , exposure dose, Data Analysis, BCD technology, Canon Scanner systems, Canon i-Line Stepper, SPC monitoring, process recipes, Canon DUV stepper, DNS track, Lean Manufacturing, Alignment, process characterization, defect analysis, Process Automation, root-cause analysis, photolithography equipment

safety guidelines, Troubleshooting, Doe, Analytical Skills, machine operation procedure

Vision systems, Automation, Process improvement, Robotics control systems, Six Sigma methodologies

Pmo, 8D reporting, Fmea, Spc, Doe

Excel, MATLAB, data analysis tools, backend wafer process, Spc Techniques, probe test analysis, Jmp