fab metrology tools, cvd, materials characterization, NAND cell structures, ald, device physics, vacuum systems, electrical test methods, plasma processes, chemical reactions

data interpretation, cvd, materials science, fab metrology, ald, experimental methods, vacuum systems, chemical reactions, semiconductor process tools

Bom, materials characterization, mechanical assessment, Product Development, Continuous Improvement, cross functional integration, Control Plans, prototype build, engineering documentation, Root Cause Analysis, defect catalog

process flow , Packaging Assembly, Dicing, BEOL, Litho, Plating, Advanced Packaging architecture, wire bonding, Back Grinding, Reconstitution, PVD, Etch, Molding, Unit Processes, cleanroom environment, semiconductor technology, cvd