particle counters, Spc, chemical reactions, process tuning, ellipsometry, Technology Transfer, XRR, Doe, basic device physics, vacuum systems, process integration, Sops, Documentation, recipe setup, thickness measurement, Monitoring, Root Cause Analysis, thin film processes, cvd, fab metrology tools, NAND cell structures, ald, TEM, Sem, plasma processes

reliability modeling, process-device interactions, electrical stress testing, cvd, thin film processing, EELS, EDX, ald, sims, TEM, Xps