Vapor etch, Memory process flow, Particle counters, Fab metrology tools, Electrical evaluation methods, Selective chemical etching, Spc, Wet strip, Thickness measurement, Dry strip, Data analysis systems, Doe, Vertical NAND

statistical data analysis , process monitoring methodologies, process development, Spc, FDC, 8D, plasma etching fundamentals, Root Cause Analysis, dry etch processes, silicon etch, Dmaic, process troubleshooting, APC, oxide etch, profile control, Doe, process control systems, process characterization

Ms Office, AI coding, Jmp, data science basics, Statistical Process Control, plasma dry etch reactors, Python coding, plasma chemistry, SAS software, surface phenomena, plasma physics, dry etch process development