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Responsibilities:
- To take on reliability accountability for Singapore Fab 10 with cross-functional projects and tasks which include but not limited to
Understand semiconductor reliability failure mechanisms and physics
Understand RG and FG process technology and risks on manufacturing quality
Understand probe testing, device datasheet spec, and device characterization knowledge
Accountable for Fab Reliability performance, define Wafer Level Reliability (WLR) sampling plan, Outgoing Quality and Reliability Monitoring (OQRM) matric, Fab process SWR study and conversion risk assessment
Partner with Fab 10 PI/ PEE and Global TD, QE, Product, Test engineering team to meet intrinsic targets through process improvement
Perform risk assessment on Class 1 and Class 2 process conversions and advise on data collection requirements and conversion roadmap
Development of WLR capability as a proxy for equivalent package level reliability test
Deep dive in Product Intrinsic Scorecards and Key Metric Understanding (Endurance, Retention, Program Disturb, X-temp, etc)
Part of the Fab quality team contributing as SME in reliability fail modes and its associated detection, drives and engages in quality projects for overall Excursion mitigation
Act on and provide Corrective and Preventive Actions for CQE and FEMQA teams with regards to customer feedbacks on quality and product issues
Requirements:
Bachelor's/Master's Degree in Electrical/Electronic Engineering, Microelectronic, Material Science, Physics, Data Science and Analytics background or equivalent is preferred
Experience in NAND reliability work/ EFA will be added advantage
Good understanding of CMOS device physics is an added advantage
Excellent problem-solving and analytical skills
Knowledge of NAND devices operation and datasheet is an added advantage
Understanding of reliability testing flow, probe test methodology and device characterization including array operation, customer feature and specification is an added advantage
Highly motivated individual who loves challenges with a growth mindset will be preferred
Integrates AI-assisted tools and insights into daily work to improve efficiency, quality, or effectiveness, exercising sound judgment and complying with organizational standards and legal requirements.
Contributes to a culture of continuous improvement by identifying, testing, and sharing AI-enabled enhancements within one's scope of work.
Ability to apply baseline digital fluency and role‑appropriate AI literacy to use AI‑enabled tools responsibly and effectively for research, analysis, content creation, problem‑solving, operational tasks, and achieving business outcomes.
Embody Micron's core values:
People - Respect, develop, and empower others
Innovation - Drive continuous improvement and breakthrough thinking
Tenacity - Show grit and determination
Collaboration - Build trust and foster teamwork
Customer Focus - Deliver excellence and value
Speed - Act with purpose and set the pace
Job ID: 153611013
Skills:
probe testing device datasheet spec, Endurance Retention Program, Product Intrinsic Scorecards, NAND devices operation, SWR study and conversion risk assessment, reliability testing flow, AI-assisted tools, semiconductor reliability failure mechanisms, probe test methodology, RG and FG process technology, device characterization
Skills:
Risk Assessment, Procurement, Resource Utilization, Engineering Drawings, Cost Control
Skills:
Data Analytics, Statistical Analysis, yield analysis methodologies, backend manufacturing processes, AI-assisted tools, semiconductor device behavior, pareto analysis
Skills:
Quality management tools, PCB Assembly, Root Cause Analysis, High-mix low-volume manufacturing, Manufacturing Engineering, Box-build, Process development, Smt, Production ramp-up, Lean Six Sigma
Skills:
Memory Management, Software Development Life Cycle, data structures, Agile Methodologies, Linux systems programming, Application Resiliency, enterprise-authorized AI-assisted software development tools, real-time messaging architectures, low-latency optimization, UDP socket programming, Security