Java, Groovy, Perl, Ruby, Python, Data Analysis, Thermal content, Debug, Silicon Characterization, MBIST, HSIO, Advantest V93K, Advantest SMT7, ATE test solutions, ATPG, DFT Design-For-Test architecture, Scan

Unix, Windows, Linux, yield analysis, statistical analysis techniques, test readiness, thermal solution management, failure triage, Co-Package optics, wafer sort, ATE hardware development, Advantest 93K, high-Speed interfaces

Test Methodologies, NAND technology, yield analysis, electrical failure analysis, manufacturing test flows