reliability test , Electronic Circuits, VLSI test techniques, design for experiment, ATE test platforms, design for manufacturing, assembly process, design for test, Failure Analysis, quality concept, Advantest 93K, foundry process, digital analog functional block

statistical data analysis , Silicon Validation, Wafer sort, Silicon Characterization, Final test, Post-silicon engineering, Yield optimization, DOE planning, Debugging ATE test programs

statistical data analysis , Silicon Validation, characterization, DOE Planning, Post-Silicon Engineering, Debugging ATE Test Programs, Silicon Bring-up, Final Test, ATE Platforms, Wafer Sort, Yield Analysis, Product Qualification, Scripting or Automation

semiconductor test processes, ATE equipment, test programming, ATE test methodology

statistical data analysis , LabVIEW, UFlex, Teradyne IFlex, Power Management IC measurement techniques, Advantest 93K ATE, root-cause investigation, wafer sort final testing

Java, C, VB, Python, Semiconductor Physics, Sensors performance characterization, VLSI technologies, Machine Learning basics, Exensio, data analytic tools, Advantest 93K, Digital Communication concepts, Digital Baseband products, ATE test program development

C, Unix, Svn, Java, Windows, Linux, Ruby, Python, Perl, Statistical Analysis, Git, CVS, Advantest 93K, ATE test program development