test equipment , module manufacturing processes, Data Analysis, OSA assembly, failure analysis techniques, Digital Circuits, design of experiments, Schematics, PCBA, fault isolation techniques, optical transceiver products, device physics, device characterization

Data Analytics, fib, yield enhancement, Nonvolatile Memory Technologies, EELS, Elemental Analysis, AI-driven solutions, Electrical Failure Analysis, EDS, process integration, TEM, Sem