test program development , Correlation, test hardware development, Burn-In Boards, final test, Probe Cards, Advantest V93K, Failure Analysis, test data analytics, wafer sort, Silicon Characterization, ATE test development, Load Boards, shmoo analysis, yield improvement, statistical methods, Burn-In

Java, C, Python, Statistical data analysis techniques, Silicon Characterization, Test Methodology Development, Data analysis and visualization tools, Product Engineering, Semiconductor Test Development

Java, Perl, Python, MBIST, System Level Testing, AI architecture, Cadence EDA tools, DFT and ATE test methodologies, Functional High speed IO, ATPG, Scan, AMS pattern development and debug

electrical reliability testing, Failure Analysis, ISO 17025 standards, root cause investigation, Vibration, humidity, thermal cycling

System Architecture, Failure Analysis, test flows, device validation, data extraction and analysis, NAND design, AI workflow solutions

electrical reliability testing, Failure Analysis, ISO 17025 standards, root cause investigation, Vibration, humidity, thermal cycling

electrical reliability testing, Failure Analysis, ISO 17025 standards, root cause investigation, Vibration, humidity, thermal cycling

Thermo-Compression Bonding, statistical methods, DOE methodologies, Advanced Packaging Process Development, Spc, FDC, Hybrid Bonding, engineering principles, AI automation, process characterization, advanced analytics tools, reliability data, Flip Chip Assembly, Data Analysis, Metrology