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Showing 8 jobs
Skills:
Product Testing, Active optical alignment, Ongoing reliability testing, Wire bond, 1.6T products, Report Generation, Burn-in, Quality control best practices, Process implementation for optical products, Root cause corrective action, Debug failure analysis, Optical transceiver manufacturing, Die bond, Optics FA processes and tools, Yield analysis, Quality Management System, Optical assembly processes, Root cause problem solving, Manufacturing BOMs, Data Analysis, Quality standard requirements
Skills:
Auto Test Equipment, UltraFlex test handler, yield analysis, quality management tools, Semiconductor Manufacturing, debug skills, Test Development, Advantest 93K, device physics, wafer prober
Skills:
Scripting, Project Management, Reliability Test Plan and Execution, Root Cause and Resolution of Qual and RMA Device Issues, Statistics and Data Analysis Tools, Reliability Test Flow Development, Cross-Functional Collaboration, DPM reduction, Process Conversions, Risk Management
Skills:
Machine Learning, APQP, Iso 9001, Fmea, Reliability Testing, AI analytics, engineering automation, DFSS, Six Sigma, root-cause analysis
Skills:
Zigbee, Matter, RF-enabled devices, Wi-Fi, IC manufacturing test processes, Failure Analysis, Statistical problem-solving methods, Analog mixed-signal ICs, Data analysis tools
Skills:
Power Bi, Sql, Jtag, automation, Excel, Python, Scripting, guardband optimization, DFT features, yield analysis, MBIST, CREST, Jmp, data-driven decision making, Silicon Characterization, Scan, Statistical Modeling, Doe, correlation studies, semiconductor test methodologies, engineering data analysis tools
Skills:
Automation Scripting, Power Bi, Sql, Jtag, Excel, Python, DFT features, yield analysis, AI-assisted solutions, MBIST, CREST, Jmp, data-driven decision making, Silicon Characterization, Scan, Statistical Modeling, semiconductor test methodologies
Skills:
Automation Scripting, Power Bi, Sql, Jtag, Excel, Python, DFT features, yield analysis, AI-assisted solutions, MBIST, CREST, Jmp, data-driven decision making, Silicon Characterization, Scan, Statistical Modeling, semiconductor test methodologies
