semiconductor process , back-end-of-line reliability, Minitab, Fmea, Reliability Testing, reliability failure mechanisms, 8D, gate oxide transistor device, device physics, Jmp

Perl, Python, JMP statistical analysis tool

Perl, Python, JMP statistical analysis tool

dry etch process engineering, Fmea, Spc, Process Optimization, Troubleshooting, Doe

Python, Risk Management, Project Management, Mentorship and Development of Others, Jmp, Cross-Functional Collaboration, Reliability Test Flow Development, DPM reduction, Technical Decision Making, Promotion of Innovation, Root Cause and Resolution of Qual and RMA Device Issues, Statistics and data analysis tools, Process Conversions and HVM, Electrical and Electronics Engineering, Reliability Test Plan and Execution

GaN epitaxial structures, mocvd, AFM, Xrd, TEM, Sem, Jmp

Root Cause Analysis, Large dataset interpretation, Semiconductor process integration, Statistical data analysis correlation development, Technology Development, Optical and e-beam inspection technologies

Data Analytics, Machine Learning, Predictive Modeling, automation, Statistical Analysis, dry etch equipment fundamentals, semiconductor process integration, process optimization methodologies, materials interactions, etch chemistry profile control, virtual process modeling, plasma physics, CCP plasma etch technologies, plasma-surface interactions