Automation Scripting, Power Bi, Sql, Jtag, Excel, Python, DFT features, yield analysis, AI-assisted solutions, MBIST, CREST, Jmp, data-driven decision making, Silicon Characterization, Scan, Statistical Modeling, semiconductor test methodologies

Data acquisition and analysis, System integration and validation, System-level engineering, Hardware debugging and lab testing, Test plan development and execution, Root cause analysis and troubleshooting, PLC control systems

Unix, Usb, C, Os, Windows, BIOS, Perl, Linux, Pcie, Sata, Firmware, Ruby, Python, x86 CPU architecture, standard interfaces, DDR memory, driver interactions, Signal Integrity, xGMI

Automation Scripting, Power Bi, Sql, Jtag, Excel, Python, DFT features, yield analysis, AI-assisted solutions, MBIST, CREST, Jmp, data-driven decision making, Silicon Characterization, Scan, Statistical Modeling, semiconductor test methodologies

Java, Machine Learning, Usb, Linux Shell Scripting, Jtag, Linux, Perl, Pcie, Debugging, Python, silicon debug, Server platform, Ai, ATE test class method, PC systems, Advantest 93k platform, Failure Analysis, high bandwidth memory, Customer Reference Board, PCB board

Java, Groovy, Perl, Ruby, Python, Data Analysis, ATE test platforms, Debug, Thermal content, Silicon Characterization, calibration methodologies, MBIST, NPI experience, active thermal control, HSIO, Advantest V93K, Advantest SMT7, ATPG, power and performance characterization, DFT Design-For-Test architecture, Scan, power management features