Automation Scripting, Power Bi, Sql, Jtag, Excel, Python, DFT features, yield analysis, AI-assisted solutions, MBIST, CREST, Jmp, data-driven decision making, Silicon Characterization, Scan, Statistical Modeling, semiconductor test methodologies

yield analysis, Analog Design, semiconductor product characterization, power MOSFET design, semiconductor physical failure analysis, statistical analysis tools, improvement bench test setup, opto-electronics design, ATE testing

Java, Groovy, Perl, Ruby, Python, Data Analysis, ATE test platforms, Debug, Silicon Characterization, calibration methodologies, MBIST, NPI experience, active thermal control, HSIO, Advantest V93K, Advantest SMT7, ATPG, power and performance characterization, DFT Design-For-Test architecture, Scan, power management features

Java, Groovy, Perl, Ruby, Python, Data Analysis, ATE test platforms, Debug, Thermal content, Silicon Characterization, calibration methodologies, MBIST, NPI experience, active thermal control, HSIO, Advantest V93K, Advantest SMT7, ATPG, power and performance characterization, DFT Design-For-Test architecture, Scan, power management features

Automation Scripting, yield analysis, Silicon Characterization, Statistical Modeling, AI-assisted solutions, semiconductor test methodologies, data-driven decision making

Computer Architecture, Data Analytics, Silicon Characterization, Analog Design, solid state physics, FT SLT test methodology, Wafer sort

Ml, automation, Advanced Analytics, post-silicon test validation, Jmp, NAND Flash architectures, memory circuits, MOSFET device physics, scripting Python, Failure Analysis, Ai, DFT probe test infrastructure, test chips, CMOS, Regression, array periphery interactions, Data Analysis, pre-silicon simulation, semiconductor devices

yield analysis, improvement bench test setup, semiconductor product characterization, statistical analysis tools, semiconductor physical failure analysis, power MOSFET design, ATE testing, Analog Design, opto-electronics design