C, Python, tester bring-up, failure investigation, Debug, debugging methodologies, AI-assisted software development tools, characterization, semiconductor test platforms, Root Cause Analysis

validation engineering , C, Python, lab instrumentation, failure investigation, logic analyzers, Oscilloscopes, engineering tool development, Root Cause Analysis, semiconductor test engineering, debugging methodologies, AI-assisted software development tools, power instrumentation, Product Engineering

Technical Documentation, corrective preventive action, Engineering Drawings, continuous improvement tools, Lean Principles, waste reduction methodologies, structured problem-solving methodologies, Root Cause Analysis

System Architecture, Product Selection, Root Cause Analysis, Specification compliance, Electronics Engineering, Electrical discrimination studies, Technical Presentations, Solution optimisation, Fault current calculations, Mechanical Engineering, Troubleshooting

testers , power integrity , Unix, Microsoft Office, Linux, ALLEGRO, boot BIOS OS-level testing, high-speed interfaces, Test Handlers, Advantest 93K testers, Cadence, ATE hardware solutions, wafer probe and package test hardware, AI accelerator GPU testing, Root Cause Analysis, Pcb Layout, Signal Integrity, hardware test plans, Probers, Socket and Thermal Solutions

testers , power integrity , Unix, DDR, Pcie, Usb, Microsoft Office, Linux, Ethernet, ALLEGRO, high-speed interfaces, Cadence, ATE hardware solutions, wafer probe and package test hardware, AI accelerator GPU testing, SERDES, Probers, boot BIOS OS-level testing, Test Handlers, Advantest 93K testers, Root Cause Analysis, Pcb Layout, Signal Integrity, hardware test plans, Socket and Thermal Solutions

testers , power integrity , Unix, DDR, Pcie, Usb, Microsoft Office, Linux, Ethernet, ALLEGRO, high-speed interfaces, Cadence, ATE hardware solutions, wafer probe and package test hardware, AI accelerator GPU testing, SERDES, Probers, boot BIOS OS-level testing, Test Handlers, Advantest 93K testers, Root Cause Analysis, Pcb Layout, Signal Integrity, hardware test plans, Socket and Thermal Solutions

lasers , Statistical Analysis, Telcordia GR-468, reliability modeling, fib, DFB CW lasers, X-ray spectroscopy, HTOL, Jmp, T H TC, Optoelectronic SiPs, Failure Analysis, Minitab, degradation modeling, Silicon Photonics ICs, HAST, JEDEC, Sem, root cause investigations