metallization , Python, fib, dielectric deposition, Jmp, mocvd, ICP RIE, dry wet etching, pecvd, ald, TEM, Sem, data analysis software, photolithography

Microsoft Excel, Fmea, Spc, Powerpoint, RCA methodology, Jmp

metallization , Python, Laser Characterization, Process Flow Ownership, gaas, InP, Dry Wet Etching, FIB Diagnostics, Jmp, InGaAsP, photolithography, III-V Compound Semiconductors, Yield Performance Optimization, Semiconductor Laser Physics, ICP RIE, Dielectric Deposition, pecvd, Thin Film, Epitaxy MOCVD, ald, TEM, Sem

Excel, experimental splits, Pantheon, Powerpoint, CMOS processing

APQP, Data Analysis, Spc

SAP, Microsoft Excel, hand gages, inspection gages, height gage, dial indicator, Micrometer, Microsoft Word, CORE Tools, dimensional inspection, AS9102 requirements, 5S standards, Delta FAI, CMM programming

Tableau, non-volatile memories NAND, process integration optimization, Jmp, NAND process flow, Data Analysis, yield reliability issues

MS PowerPoint, HP basic TIJ and Ink supply knowledge, Creo, Setting up PC and mobile OS, Jmp

Microsoft Excel, Condition Monitoring, Safety protocols, Maximo EAM, Microsoft Word