technical direction , High aspect ratio etch development, Conflict Resolution, Project management, Plasma Dry Etch Technology, Process development, Mentoring, Performance management

knowledge management systems , sop development , Metrology tools, Root Cause Analysis, Process Optimization, Particle counters, Electrical evaluation methods, Thin film deposition techniques, Defect analysis, Yield improvement, ellipsometry, process integration, Thickness measurement instruments, CD-SEM