Data Analysis, equipment interaction, Spc, manufacturing principles, Root Cause Analysis, process discipline

Data Analysis, Process Engineering, Defect analysis methodologies, Chemical vapour deposition

Power Bi, Data Analysis, Iso 9001, Reliability Testing, Calibration, IATF 16949, Iso 17025, Lab equipment operation, Troubleshooting, Reporting

Spc, Doe, wafer dicing operations, process control documentation, yield improvement methodologies, Root Cause Analysis