Data Analysis, project management, process integration, semiconductor process engineering, Process Optimization, yield improvement, Problem-solving

Tableau, Sql, RDA, SPC tools, FMEA defect analysis tools, Wafer risk modeling, Metrology, Sampling strategies, capacity modeling, Cycle time management

Power Bi, Data Analysis, Iso 9001, Reliability Testing, Calibration, IATF 16949, Iso 17025, Lab equipment operation, Troubleshooting, Reporting

Spc, Doe, wafer dicing operations, process control documentation, yield improvement methodologies, Root Cause Analysis