manufacturing processes , Semiconductor structures and manufacturing, DC measurements, Fmea, Frequency generators, Oscilloscopes, Test time reduction activities, Fab transfers, Electrical Analysis, Semiconductor physics failure mechanisms, Fab process qualifications, FTA, Fishbone Analysis, 8-D Methodology, Statistical Yield Analysis, Electrical measurement methods, Doe, Is Is-not and Why-Why, FE and BE yield improvements, Microcontroller programming with C, SBL