Test Methodology, UltraFlex test handler, yield analysis, Adventest 93K, quality management tools, debugging skills, wafer prober

Data Analytics, High Speed IO operation, x86 GPU, device characterization, Circuit sensitivity analysis, Silicon Characterization, Fab process, Yield improvement, Product management methodology

Data Analytics, device characterization, High Speed IO operation, x86 GPU, Circuit sensitivity analysis, Silicon Characterization, Product management methodology, Fab process, Yield improvement

Data Analytics, device characterization, High Speed IO operation, x86 GPU, Circuit sensitivity analysis, Silicon Characterization, Product management methodology, Fab process, Yield improvement

Product Test Fab-Process, Wafer Fabrication Processes, Analytical Problem-Solving, Electrical and Physical Failure Analysis, Semiconductor Device Physics, Yield Improvement

Auto Test Equipment, UltraFlex test handler, yield analysis, quality management tools, Semiconductor Manufacturing, debug skills, Test Development, Advantest 93K, device physics, wafer prober

Data Analytics, device characterization, High Speed IO operation, x86 GPU, Circuit sensitivity analysis, Silicon Characterization, Product management methodology, Fab process, Yield improvement activities