Data Analytics, device characterization, High Speed IO operation, x86 GPU, Circuit sensitivity analysis, Silicon Characterization, Product management methodology, Fab process, Yield improvement

Soc Architecture, Data Analysis, product test patterns, yield management system coding language, failure analysis techniques, database structure, yield enhancement techniques

Soc Architecture, Data Analysis, product test patterns, yield management system coding language, failure analysis techniques, database structure, yield enhancement techniques

Product Test Fab-Process, Wafer Fabrication Processes, Electrical and Physical Failure Analysis, Fault Diagnostic Capabilities, Semiconductor Device Physics, Yield Improvement

Report Generation, Data Analysis, Quality Management System, Optics FA processes and tools, Yield analysis, Reliability Testing, NPI support, Quality control best practices, Optical transceiver manufacturing, Root cause corrective action, Process and yield qualification, Optical assembly processes, Manufacturing BOMs, Process Implementation, Root cause problem solving, Debug failure analysis

Data Analytics, device characterization, Circuit sensitivity analysis, Fab process, High Speed IO operation, x86 GPU, Yield improvement, Silicon Characterization, Product management methodology

Data Analytics, device characterization, Circuit sensitivity analysis, Fab process, High Speed IO operation, x86 GPU, Yield improvement activities, Silicon Characterization, Product management methodology

Power Bi, Sql, Jtag, automation, Excel, Python, Scripting, guardband optimization, DFT features, yield analysis, MBIST, CREST, Jmp, data-driven decision making, Silicon Characterization, Scan, Statistical Modeling, Doe, correlation studies, semiconductor test methodologies, engineering data analysis tools