promis , Rms, Spc, Klarity ACE, Si-View, Ms Office Applications, 8D, CIP programs, TS16949 Quality Standard, Cp, SPC charts, Jmp, ECN, Space, TECN, Doe, SPSR, Cpk, SLDB, DCOP, metrology tools, mrb

cmp , Etch-Dry, Thin Film-CVD, Physical Vapor Deposition, Data-driven analytics, Metrology, Wet Photolithography, Advanced data analysis, diffusion