Chemistry, Semiconductor Wet Process development, Chemical kinetics, Mass transport, Thermodynamics

statistical data analysis , lithography simulation tools, immersion lithography, Spc, photolithography process development, low k1 imaging, material characterization, Doe, polarized illumination, Optics

Test Methodology, Silicon Validation, yield analysis, Dft, silicon process fundamentals, manufacturing debug, Advantest 93K, ATE test development, Smart Scale, DFM concepts, Teradyne UFLEX testers

Test Methodology, Silicon Validation, manufacturing debug, Advantest 93K, Smart Scale, ATE test development, Teradyne UFLEX testers, Dft, silicon process fundamentals, DFM concepts, yield analysis