Power Bi, Sql, Jtag, automation, Excel, Python, Scripting, guardband optimization, DFT features, yield analysis, MBIST, CREST, Jmp, data-driven decision making, Silicon Characterization, Scan, Statistical Modeling, Doe, correlation studies, semiconductor test methodologies, engineering data analysis tools

Automation Scripting, Power Bi, Sql, Jtag, Excel, Python, DFT features, yield analysis, AI-assisted solutions, MBIST, CREST, Jmp, data-driven decision making, Silicon Characterization, Scan, Statistical Modeling, semiconductor test methodologies

Automation Scripting, Power Bi, Sql, Jtag, Excel, Python, DFT features, yield analysis, AI-assisted solutions, MBIST, CREST, Jmp, data-driven decision making, Silicon Characterization, Scan, Statistical Modeling, semiconductor test methodologies

Test Methodology, yield analysis, UltraFlex test handler, Adventest 93K, quality management tools, debugging skills, wafer prober

statistical data analysis , data mining, production test, IC development, wafer processing, quality and reliability, Digital principles, DfA methods, IC production technology, Fabless Standard Logic CMOS Process Technologies, assembly, yield logistics

Automation Scripting, yield analysis, Silicon Characterization, Statistical Modeling, AI-assisted solutions, semiconductor test methodologies, data-driven decision making