Test Methodology, UltraFlex test handler, yield analysis, Adventest 93K, quality management tools, debugging skills, wafer prober

Solidworks, Power Bi, Tableau, Python, yield enhancement, Data Analysis, process integration

Data Analytics, High Speed IO operation, x86 GPU, device characterization, Circuit sensitivity analysis, Silicon Characterization, Fab process, Yield improvement, Product management methodology

Test Methodology, Silicon Validation, yield analysis, Dft, silicon process fundamentals, manufacturing debug, Advantest 93K, ATE test development, Smart Scale, DFM concepts, Teradyne UFLEX testers

Data Analytics, device characterization, High Speed IO operation, x86 GPU, Circuit sensitivity analysis, Silicon Characterization, Product management methodology, Fab process, Yield improvement

Data Analytics, device characterization, High Speed IO operation, x86 GPU, Circuit sensitivity analysis, Silicon Characterization, Product management methodology, Fab process, Yield improvement

Product Test Fab-Process, Wafer Fabrication Processes, Analytical Problem-Solving, Electrical and Physical Failure Analysis, Semiconductor Device Physics, Yield Improvement

Data Analytics, device characterization, High Speed IO operation, x86 GPU, Circuit sensitivity analysis, Silicon Characterization, Product management methodology, Fab process, Yield improvement activities